Focused ion beam and SEM
The Zeiss Crossbeam 550 combines a focused ion beam with scanning electron microscopy. The facility documents imaging, ion-beam material removal and associated analytical tools. A project inquiry should separate the required imaging result from any sectioning or preparation work, then confirm sample compatibility and operator support.
Create an account to search detailed equipment records, compare documented capabilities and build a research shortlist. Facility access, project acceptance, rates and scheduling must be confirmed separately.
